Don’t Scrap It, Save It: Feedforward Control For Modern Semiconductor Manufacturing

<p>By measuring each wafer after lithography and adjusting the next etch step, fabs can pull more wafers back into spec. </p> <p>The post <a href="https://semiengineering.com/dont-scrap-it-save-it-feedforward-control-for-modern-semiconductor-manufacturing/">Don&#8217;t Scrap It, Save It: Feedforward Control For Modern Semiconductor Manufacturing</a> appeared first on <a href="https://semiengineering.com">Semiconductor Engineering</a>.</p>